Interlacing in Atomic Resolution Scanning Transmission Electron Microscopy

Abstract Fast frame rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling beam dose, capturing situ events, or reducing the appearance scan distortions. While several strategies exist increasing rates, many impact image quality require investment advanced hardware. Here, we present an interlaced imaging approach to achieve minimal loss with faster that can be implemented on existing controllers. We further demonstrate our interlacing provides best possible strain precision given dose compared other contemporary approaches.